Advanced Analysis Tools 

Specialised Devices for Signal Acquisition and Processing in Semiconductor Research and Industrial Growth

LPS

Lateral Photovoltage Scanning detects differential photo-conductivity. It has the advantage, to work without microwave radiation. The resistivity variations act as the sensor and generate voltage changes in the nano- to microvolt range which can be robustly measured using an advanced digital signal processing developed by the LPcon GmbH. The signal-to noise ratio is sufficient to detect variations even within NTD material.


SPL

Scanning Photo-Luminescense
detects luminescence photons at ultra high resolutions and sensitivity using a patented method that employs modulated lasers and a high sensitivity multi-photodiode array. Through a highly focussed laser spot it can reach resolutions far exceeding what is possible with current CCD camera techniques. 

Lifetime

The combination of simultaneous and phase-sensitive SPL and LPS signal measurement enables the calculation of the carrier lifetime using a novel and patented method.

Our Technologies for Semiconductor Analysis


We are developing new and advancing current technologies through close cooperation with research institutes and companies.

SPL

The luminescence signal from laser excitation with 833 nm  wavelength reveals inhomogeneities and striations relevant for the minority carrier lifetime. 

LPS

Reveals the solid-liquid interfaces, grains, precipitates and inclusions. The deflection radius can be calculated from the 2D scan-data.

Lifetime

Lifetime map of a multi-crystalline silicon crystal calculated from the SPL signal using our unique data acquisition and processing technique.

 +49 (0) 30 6392 3226

15


YEARS OF EXPERIENCE

7


COMPANIES AND RESEARCH INSTITUTES WORLDWIDE 
USING LPcon TECHNOLOGY
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5


COUNTRIES LPcon DEVICES HAVE BEEN SHIPPED TO

Our office

Volmerstraße 9, 12489 Berlin, Germany
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